TOM CombiLine is a compact desktop system for inspection of prototypes and evaluation samples of instrument clusters. The TOM CombiLine has been designed to inspect display contents like symbols and characters.The innovative easyOCR function allows inspection of Latin, Cyrillic, Greek and East Asian characters without teaching processes. The easySymbolMatch function enables the automated generation of highly efficientclassifiersused for symbol detection and highly efficientobject recognition. Furthermore, the TOM system can be used to check backlight brightness and indicator positions in instrument clusters.

Images of the instrument clusters are not viewed directly but through an integrated mirror system to ensure the system’s compactness. The flexibleUUT fixtureenables the optical inspection of instrument clusters of any type. Delivery of the test system includes a PC and the image processing software TOM Line. Depending on the inspection application the system can be equipped with up to three 5-megapixel cameras. UUT control including restbus simulation is optionally available.